Contenido del seminario
Ámbito:
Programa de Doctorado en: Psicología Clínica y de la Salud
Línea/Tema de investigación: Modelos y Aplicaciones en Estadística y Psicometría
Abstract:
The EM algorithms for CDMs are straightforward extensions of the EM algorithms for traditional IRT models, at least when the attribute structure has a saturated formulation. However, we need to note a few differences when CDMs are involved. First, using quadrature nodes to approximate continuous is no longer necessary as the attributes are already discrete. And second, for a class of CDMs (e.g., deterministic input, noisy, “and” gate [DINA] model, generalized DINA [G-DINA] model), estimates of the item parameters can be obtained separately based on the partitions of the attribute vectors. That is, for these models, closed-form solutions are available. This session will focus on estimating the DINA and G-DINA model parameters, as well as EAP and MAP estimation of the attribute vectors. Time permitting, EM algorithms for the higher-order DINA model and the additive model under the logit link will also be discussed.
About the speaker:
Jimmy de la Torre is a Professor in the Faculty of Education at The University of Hong Kong. He is also currently a Chair Professor at the National Taichung University of Education in Taiwan, and an Honorary Professor at the Universidad Autonoma de Madrid in Spain. His primary research interests are in the field of psychological and educational testing and measurement, and the use of diagnostic assessment to support classroom teaching and learning. As one of the leading researchers in the field of cognitive diagnosis modeling, his work has covered both theoretical and implementation issues in this area. In 2009, he was named by the White House as one of the recipients of the Presidential Early Career Awards for Scientists and Engineers. He also received the Jason Millman Promising Measurement Scholar Award in 2009 from the National Council on Measurement in Education. He is the editor-in-chief of the Journal of Educational Measurement, an associate editor of Applied Psychological Measurement, and a member of the Psychometric Society Board of Trustees.