Contenido del seminario
Programa de Doctorado en: Psicología Clínica y de la Salud
Línea/Tema de investigación: Modelos y Aplicaciones en Estadística y Psicometría
In the previous session, a number of small examples were used to illustrate how MCMC can be implemented; in this session, MCMC will be applied to an IRT model and an CDM, namely, the 2PL and the higher-order DINA (HO-DINA) models. One advantage of MCMC is the ease by which existing algorithms can be extended to accommodate more complex models. For example, we can easily extend the algorithm for obtaining the expected a posteriori of the ability in the context of the 2PL to include item parameter estimation. We will discuss the details of the MCMC algorithms for the 2PL and HO-DINA models, which include the prior specifications and derivation of the full conditional distributions. We will also go over the four-parameter beta distribution, inverse-Wishart distribution, and the Gelman-Rubin convergence statistic R. Time permitting, MCMC algorithms for multi-unidimensional ability estimation will be discussed.
Jimmy de la Torre is a Professor in the Faculty of Education at The University of Hong Kong. He is also currently a Chair Professor at the National Taichung University of Education in Taiwan, and an Honorary Professor at the Universidad Autonoma de Madrid in Spain. His primary research interests are in the field of psychological and educational testing and measurement, and the use of diagnostic assessment to support classroom teaching and learning. As one of the leading researchers in the field of cognitive diagnosis modeling, his work has covered both theoretical and implementation issues in this area. In 2009, he was named by the White House as one of the recipients of the Presidential Early Career Awards for Scientists and Engineers. He also received the Jason Millman Promising Measurement Scholar Award in 2009 from the National Council on Measurement in Education. He is the editor-in-chief of the Journal of Educational Measurement, an associate editor of Applied Psychological Measurement, and a member of the Psychometric Society Board of Trustees.